EE 6173 - Fault Testable Design

Basic concepts of reliability. Physical faults and testing. Test generation for combinational and sequential logic circuits, random testing, and signature analysis. Fault tolerance and circuit redundancy, self testing and fail-safe design, fault tolerant VLSI design, practical fault tolerant systems. Self testing, design for testability, built-in test, boundary scan testing, IEEE standards.

Requisites
EE 5143
Credit Hours: 3.0
Repeat/Retake Information: May not be retaken.

Lecture/Lab Hours: 3.0 lecture

Eligible grades: A-F,WP,WF,FN,FS,AU,I