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May 13, 2024
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E E 617 - Fault Testable Design
Basic concepts of reliability. Physical faults and testing. Test generation for combinational and sequential logic circuits, random testing, and signature analysis. Fault tolerance and circuit redundancy, self testing and fail-safe design, fault tolerant VLSI design, practical fault tolerant systems. Self testing, design for testability, built-in test, boundary scan testing, IEEE standards.
Prerequisites
Prereq: 514 or perm.
Credits: (4)
Lecture/Lab Hours
3 lec, 2 lab.
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